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home > E+H Metrology MX 152 Wafer Thickness Measurement System Siemens PC Win 7 OS > E+H Metrology MX 152 Wafer Thickness Measurement System Siemens PC Win 7 OS

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E+H Metrology MX 152 Wafer Thickness Measurement System Siemens PC Win 7 OSE+H Metrology MX 152 Wafer Thickness Measurement System Siemens PC Win 7 OS Excellent used condition, pulled from working wafer inspection system that was only used for a couple of years before the solar company went out of business. No password available for E+H program, otherwise the system is intact as we pulled and pictured it. Conveyor included for reference, would need external controls to run it. This system was integrated into a complete

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E+H Metrology MX 152 Wafer Thickness Measurement System Siemens PC Win 7 OS

Excellent used condition, pulled from working wafer inspection system that was only used for a couple of years before the solar company went out of business. No password available for E+H program, otherwise the system is intact as we pulled and pictured it. Conveyor included for reference, would need external controls to run it. This system was integrated into a complete manufacturing line so it will no be plug and play, some software hurdles are likely.

Keyboard, mouse, monitor not included.

Included:

Siemens Rack PC: Simatic IPC647D 6AG4112-2GA31-3XX0

PC Measurement Card1: ATTI-DATA A-D 481823 APCI-3120-16_E+H

PC Measurement Card2: ATTI-DATA A-D 478361 APCI-1500

E+H Control Box: B215, B215, B215, B187, B271, B264 modules

E+H Measurement Head: MX 152

Other: conveyor section with separated drive motor and aluminum stand to mount the measurement head included. (CONVEYOR can't be shipped overseas without additional cost as it wont fit within the footprint of the box that will hold the other hardware, contact us for a quote)

We have more pictures, contact us if you want to see them.

This item is free shipping to the lower 48 States, contact us for a quote elsewhere.

Feel free to contact us with any questions

Thank you for your interest and have a great day!

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E+H Metrology MX 152 Wafer Thickness Measurement System Siemens PC Win 7 OS

Name: E+H Metrology MX 152 Wafer Thickness Measurement System Siemens PC Win 7 OS
Brand: ganaj.net
SKU: 95775889295
Price: 7499.99 USD
Availability: InStock
Rating: 4.1071 (2235 reviews)